Model | DRK-W1 | DRK-W2 | DRK-W3 | DRK-W4 |
Theoretical basis | Mie scattering theory |
Particle size measurement range | 0.1-200um | 0.1-400um | 0.1-600um | 0.1-1000um |
Light Source | Semiconductor refrigeration constant temperature control red light solid laser light source, wavelength 635nm |
Repeatability error | <1% (standard D50 deviation) |
Measurement error | <1% (standard D50 deviation, using national standard particle inspection) |
Detector | 32 or 48 channel silicon photodiode |
Sample cell | Fixed sample pool, circulating sample pool (built-in ultrasonic dispersion device) |
Measurement analysis time | Less than 1 minute under normal conditions (from the beginning of the measurement to the display of the analysis results) |
Output content | Volume and quantity differential distribution and cumulative distribution tables and graphs; various statistical average diameters; operator information; experimental sample information, dispersion medium information, etc. |
Display method | Built-in 10.8-inch industrial-grade computer, which can be connected to keyboard, mouse, U disk |
Computer system | WIN 10 system, 30GB hard disk capacity, 2GB system memory |
power supply | 220V, 50 Hz |